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Transmission Electron Microscope as an analytical tool for Materials Science and Engineering

Start Date: September 14, 2017 - 12:00 PM
End Date: September 14, 2017 - 01:00 PM

​By Dr. Sergei Lopatin
Electron Microscopy Core Lab
Venue: Building 9, Room 2325

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Abstract:

 

First, the presentation is going to address briefly the general concept or principle of Transmission Electron Microscopy (TEM) including state of the art examples. Then, several analytical techniques such as Electron Energy Loss Spectroscopy (EELS), Energy Dispersive X-ray spectroscopy (EDXS) and Lorentz TEM will be described. The application of those techniques to solve various tasks in materials science will be illustrated.

 

Bio:

 

I was born in Belarus, which is also known for White Russia.

I received my Master’s degree in Physics from Belorussian State University (Minsk). Later on I moved to US where I obtained PhD in Materials Science and Engineering from NC State University, working also as a guest scientist at Oak Ridge National lab. I did my postdoc years at Berkeley National Lab and then joined FEI Co (currently Thermo Fisher Scientific) as a Senior Research Scientist to work with Titan Transmission Electron Microscopes. My major concentration was on high-end TEM applications involving aberration correction for HR-TEM and STEM, monochromated EELS, atomic resolution EDXS, etc. After nearly 10 years dedicated to FEI co, on March of 2015 I joined KAUST Core Lab as a Senior Scientist. My primary expertise lies in the field of materials characterization by means of diverse techniques from Transmission Electron Microscopy. Such characterization involves determination of structural, electrical, optical and other properties of modern nanomaterials and based on them devices.